Yoshitoki Iijima: search on Z-Library

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1

Basic characteristics for PEN film surface modification using atmospheric-pressure nonequilibrium microwave plasma jet

Toshifumi Yuji, Takuya Urayama, Shuitsu Fujii, Yoshitoki Iijima, Yoshifumi Suzaki, Hiroshi Akatsuka

Journal:

Electronics and Communications in Japan

Year:

2010

Language:

english

File:

PDF, 836 KB

english, 2010

2

Prevention of the Reduction of CuO during X-ray Photoelectron Spectroscopy Analysis

Iijima, Yoshitoki, Niimura, Noriyasu, Hiraoka, Kenzo

Journal:

Surface and Interface Analysis

Year:

1996

Language:

english

File:

PDF, 436 KB

english, 1996

3

Hardening Process and Surface Structure of Lacquer Films Studied byX-ray Photoelectron Spectroscopy

Niimura, Noriyasu, Iijima, Yoshitoki, Miyakoshi, Tetsuo

Journal:

Surface and Interface Analysis

Year:

1996

Language:

english

File:

PDF, 456 KB

english, 1996

4

Surface analysis of polyimide bombarded by charged water droplets

Hiraoka, Kenzo, Sakai, Yuji, Iijima, Yoshitoki

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2010

Language:

english

File:

PDF, 956 KB

english, 2010

5

In-depth Analysis of X-ray Photoelectron Spectroscopy Using Giant Cluster Ion Bombardment

IIJIMA, Yoshitoki, SAKAI, Yuji, HIRAOKA, Kenzo

Journal:

Year:

2013

File:

PDF, 1.98 MB

2013

6

Ultra-trace element analysis on Si wafer surface by total reflection X-ray photoelectron spectroscopy.

IIJIMA, Yoshitoki, MIYOSHI, Kousuke, SAITO, Syuichi

Journal:

Year:

1998

File:

PDF, 1.14 MB

1998

7

XPS depth profiling of polystyrene etched by electrospray droplet impact

Yuji Sakai, Yoshitoki Iijima, Daiki Asakawa, Kenzo Hiraoka

Journal:

Surface and Interface Analysis

Year:

2010

Language:

english

File:

PDF, 403 KB

english, 2010

8

Low-energy Ar neutral beam etching method for x-ray photoelectron spectroscopy

Yoshitoki Iijima, Takahisa Yamada, Shigeo Matsumoto, Kenzo Hiraoka

Journal:

Surface and Interface Analysis

Year:

1994

Language:

english

File:

PDF, 615 KB

english, 1994

9

X-ray photoelectron spectroscopy analysis of organic materials etched by charged water droplet impact

Sakai, Yuji, Iijima, Yoshitoki, Takaishi, Riou, Asakawa, Daiki, Hiraoka, Kenzo

Journal:

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films

Year:

2009

Language:

english

File:

PDF, 783 KB

english, 2009

10

Auger Crater Edge Profiling by Water Droplet Impact

Sakai, Yuji, Iijima, Yoshitoki, Hiraoka, Kenzo

Journal:

Journal of Surface Analysis

Year:

2008

File:

PDF, 941 KB

2008

11

Recent advances in the application of total reflection x-ray photoelectron spectroscopy in the semiconductor industry

Yoshitoki Iijima, Kousuke Miyoshi

Journal:

X-Ray Spectrometry

Year:

1999

Language:

english

File:

PDF, 132 KB

english, 1999

12

Surface structure of a lacquer film analyzed by X-ray photoelectron spectroscopy.

NIIMURA, Noriyasu, IIJIMA, Yoshitoki, MIYAKOSHI, Tetsuo

Journal:

Year:

1993

File:

PDF, 772 KB

1993

13

X-ray Photoelectron Spectroscopy and Scanning Probe Microscopy Analysis of Polymethylmetacrylate Surface Etched by Charged Water Droplets

IIJIMA, Yoshitoki, NARUSE, Mikio, SAKAI, Yuji, HIRAOKA, Kenzo

Journal:

Year:

2011

File:

PDF, 922 KB

2011

14

Surface analysis of polyvinyl chloride bombarded by Ar+ and charged water droplets

Kenzo Hiraoka, Yoshitoki Iijima, Yuji Sakai

Journal:

Surface and Interface Analysis

Year:

2011

Language:

english

File:

PDF, 351 KB

english, 2011

15

Application of Giant Cluster Ion Beam Bombardment to in-depth Analysis in X-ray Photoelectron Spectroscopy

IIJIMA, Yoshitoki

Journal:

Journal of the Japan Society for Precision Engineering

Year:

2016

File:

PDF, 1.10 MB

2016

16

Shallow surface etching of organic and inorganic compounds by electrospray droplet impact

Kenzo Hiraoka, Yuji Sakai, Yoshitoki Iijima, Daiki Asakawa, Kunihiko Mori

Journal:

Applied Surface Science

Year:

2009

Language:

english

File:

PDF, 563 KB

english, 2009

17

Detection of surface impurities on Si wafers using total reflection x-ray photoelectron spectroscopy

Iijima, Yoshitoki, Miyoshi, Kousuke, Saito, Shuichi

Journal:

Surface and Interface Analysis

Year:

1999

Language:

english

File:

PDF, 400 KB

english, 1999

18

Molecular depth profiling of polystyrene by electrospray droplet impact

Yuji Sakai, Yoshitoki Iijima, Souichirou Mukou, Kenzo Hiraoka

Journal:

Surface and Interface Analysis

Year:

2011

Language:

english

File:

PDF, 608 KB

english, 2011

19

Extended x-ray absorption fine structure study on the cerium(IV)-induced DNA hydrolysis: Implication to the roles of 4f orbitals in the catalysis

Shigekawa, Hidemi, Ishida, Masahiko, Miyake, Koji, Shioda, Ryu, Iijima, Yoshitoki, Imai, Takamitsu, Takahashi, Hideyuki, Sumaoka, Jun, Komiyama, Makoto

Journal:

Applied Physics Letters

Year:

1999

Language:

english

File:

PDF, 273 KB

english, 1999

20

Diamond film characterization by analyzing C 1s peak shapes with X-ray photo-electron spectroscopy.

IIJIMA, Yoshitoki, HIRAOKA, Kenzo

Journal:

Year:

1993

File:

PDF, 1.06 MB

1993

21

Segregation of As on GaAs(100) Surface during Abrasion Process Studied by X-Ray Photoelectron Spectroscopy and Auger Electron Spectroscopy

Iijima, Yoshitoki, Muramoto, Koichi, Uemura, Masao, Hiraoka, Kenzo

Journal:

Japanese Journal of Applied Physics

Year:

1993

File:

PDF, 670 KB

1993

22

Adsorption Structures of Phosphorus, Sulfur and Chlorine on a Nickel Stepped Surface Studied by Surface Extended X-ray Absorption Fine Structure./Analysis of Chemical Bonding States of Material Surfaces with X-ray Photoelectron Spectrum

ISHI, Hideshi, IIJIMA, Yoshitoki

Journal:

Year:

1995

File:

PDF, 772 KB

1995

23

Erratum: Basic characteristics for PEN film surface modification using atmospheric-pressure nonequilibrium microwave plasma jet volume 93, number 5, 2010, pages 42–49

Toshifumi Yuji, Takuya Urayama, Shuitsu Fujii, Yoshitoki Iijima, Yoshifumi Suzaki, Hiroshi Akatsuka

Journal:

Electronics and Communications in Japan

Year:

2010

Language:

english

File:

PDF, 24 KB

english, 2010

24

Hydrogen plasma etching method for depth analysis by x-ray photoelectron spectroscopy

Yoshitoki Iijima, Toyohiko Tazawa, Kazuomi Sato, Mitsuyoshi Oshima, Kenzo Hiraoka

Journal:

Surface and Interface Analysis

Year:

2000

Language:

english

File:

PDF, 135 KB

english, 2000

25

Molecular-level etching by electrospray droplet impact

Yuji Sakai, Yoshitoki Iijima, Kunihiko Mori, Kenzo Hiraoka

Journal:

Surface and Interface Analysis

Year:

2008

Language:

english

File:

PDF, 202 KB

english, 2008

26

Analysis of Polyethyleneterephthalate Film Surface Sputtered with Ar Neutral and Ar Ion Beams

Iijima, Yoshitoki, Sato, Tetsuya, Hiraoka, Kenzo

Journal:

Japanese Journal of Applied Physics

Year:

1994

File:

PDF, 1.94 MB

1994

27

Application of total reflection X-ray photoelectron spectroscopy to boron and phosphorus on Si wafer surface measurement

Yoshitoki Iijima, Toyohiko Tazawa

Journal:

Spectrochimica Acta Part B: Atomic Spectroscopy

Year:

2004

Language:

english

File:

PDF, 505 KB

english, 2004

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